NEC releases new version of facial recognition, sponsors IAI Educational event

August 4, 2015 - 

NEC Corporation of America (NEC) announced it has released the latest version of NeoFace, the facial recognition algorithm that performed well in NIST FRVT 2013 testing.

The facial recognition algorithm is available in law enforcement investigative and real time surveillance solutions, along NeoFace Match, a comprehensive facial recognition integration tool for solutions integrators and qualified customers.

The latest version of NeoFace offers significant performance metrics in a range of applications, including non-frontal facial images with partial angles, low-resolution images, improved identification in uncontrolled environments, and increased matching rates, particularly to large databases.

NeoFace’s NIST benchmarks include a 28% improvement in accuracy in comparison to NeoFace’s previous release, eight times fewer errors than the next highest performing algorithm, NEC’s face recognition algorithms performing faster than all participating vendors, and a reduced authentication error rate by two-thirds in “one-to-one” face matching tests.

“Faced with ever-increasing threats, as well as the need for improved customer engagements and loss prevention, public safety agencies (such as law enforcement, border control, immigration) and enterprises around the world are increasingly turning to facial recognition, a highly reliable and accurate identification method,” said Raffie Beroukhim, VP of NEC Corporation of America’s biometrics solutions division. “With this release NEC remains committed to being the top biometrics solution provider for public safety and commercial applications, and is driven to deliver continued advances in facial recognition to our customers.”

NEC also announced it is sponsoring the 100th International IAI Conference, held August 2-8 at the Sacramento Convention Center in Sacramento, California.

The IAI Conference is a professional forensic conference that highlights the latest developments impacting the law enforcement industry.

NEC, which has been a long time IAI supporter and premier sponsor of the 2015 conference, presented the opening keynote session on August 3rd with American television personality (creator of America’s Most Wanted) and criminal investigator, John Walsh.

In addition to its on-site sponsored IAI activities, NEC introducing its new Biometrics Center of Excellence (COE), located in nearby Rancho Cordova.

The NEC COE is an executive briefing center and showcase for NEC’s latest biometric products including NeoScan 45 mobile fingerprint collection device and the Integra-ID 5 Multi-Modal Biometrics Identification Solution (MBIS), both of which are forensic tools for fingerprint, palmprint, and facial recognition collection and identification.

Previously reported, NEC Corporation announced that NEC India and AP Technology Services Limited (APTS) signed a memorandum of understanding (MOU) to collaborate in the areas of IT for smart city initiatives in the Indian state of Andhra Pradesh.

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About Justin Lee

Justin Lee has been a contributor with Biometric Update since 2014. Previously, he was a staff writer for web hosting magazine and website, theWHIR. For more than a decade, Justin has written for various publications on issues relating to technology, arts and culture, and entertainment. Follow him on Twitter @BiometricJustin.