CEI-Europe announces four image sensor courses

January 27, 2016 - 

CEI-Europe, a leading provider of specialist semiconductor training, has announced four image sensor courses to take place in Barcelona and Amsterdam in Q2 2016.

The courses range from introductory to advanced and are suitable for those looking to develop or enhance their understanding of image sensor technologies, applications, problems and analysis.

Course leader and professor at Delft University, Dr Albert Theuwissen explains: “As light and image sensing becomes more prevalent in every-day devices, and used for applications which are increasingly diverse, these courses are no longer just aimed at image sensor specialists – they are for all engineers, product designers, managers, researchers, programmers and physicists working with light.”

CEI-Europe Chief Executive Elisabet Larsson continued: “We work closely with candidates to ensure the course meets their expectations, but also that the subject matter is relevant and up-to-date – it’s something that CEI-Europe has always taken great pride in doing. Attendees to the Image Sensor courses are coming from more diverse parts of the science and technology industries – automotive, mobile devices, computing, drones, broadcast engineering, industrial machinery – even space. We see this diversity is a huge bonus for course attendees – they learn the essentials with us but can also gain exposure to expertise in other fields – and that makes for some really exciting collaboration opportunities both during and after the courses.”

Introductory level courses for engineers, managers and product developers new to the field, are:

Digital Imaging: Image Capturing, Image Sensors – Technologies and Applications, April 4 – 8, 2016, Barcelona, Spain

Digital Camera Systems, June 14 – 16, 2016, Barcelona, Spain

Advanced courses for established experts with a good understanding of electronics, physics and mathematics include:

Advanced Image Sensor Technology, May 23 – 25, 2016 . Amsterdam, The Netherlands

Hands-on Characterization of Solid-State Image Sensors, May 26 – 27, 2016. Amsterdam, The Netherlands

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